The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2017

Filed:

Jul. 08, 2016
Applicant:

Kiyohiro Hyo, Tokyo, JP;

Inventor:

Kiyohiro Hyo, Tokyo, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01); G06F 3/12 (2006.01); G06K 1/00 (2006.01); H04N 1/00 (2006.01); H04L 12/58 (2006.01); H04L 29/08 (2006.01); G06K 15/00 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
H04N 1/00037 (2013.01); G06F 11/079 (2013.01); G06F 11/0733 (2013.01); G06K 15/408 (2013.01); H04L 51/08 (2013.01); H04L 51/22 (2013.01); H04L 67/12 (2013.01); H04N 1/0005 (2013.01); H04N 1/00039 (2013.01); H04N 1/00042 (2013.01); H04N 1/00061 (2013.01); H04N 1/00068 (2013.01); H04N 1/00076 (2013.01); H04N 2201/0082 (2013.01);
Abstract

An information processing system includes a first and second information processing systems respectively including first and second apparatuses, and a third information processing system storing history information of the first apparatus and implementing analyzing the history information to acquire a degree of influence for an item included in the history information corresponding to a fault in the first apparatus, and generating a fault prediction logic of predicting a fault in the first apparatus using the item having a relatively high degree of influence and a value of a case where the fault occurs in the first apparatus based on a result of the analysis, and building the generated fault prediction logic into the first and second apparatuses, the first and second information processing system monitoring the history information, and detecting a state of matching a content of the built-in fault prediction logic.


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