The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2017

Filed:

Sep. 01, 2016
Applicant:

Hewlett Packard Enterprise Development Lp, Houston, TX (US);

Inventors:

Karl J. Bois, Fort Collins, CO (US);

Benjamin Toby, Fort Collins, CO (US);

David P. Kopp, Fort Collins, CO (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 1/20 (2006.01); H04B 17/336 (2015.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
H04B 17/336 (2015.01); H04L 43/16 (2013.01);
Abstract

An example communications device may include a slicer that may generate a digital output signal by thresholding a received signal according to variably set timing and voltage parameters. Testing circuitry may determine expected bit error ratios for multiple time-voltage slices by performing test operations corresponding respectively to the multiple time-voltage slices. Each of the test operations may include setting the timing and voltage parameters of the slicer based on the corresponding time-voltage slice, periodically measuring a bit error ratio based on the digital output signal and determining a confidence level for the measured bit error ratio, and in response to the determined confidence level equaling or exceeding a specified value, designating a current value of the measured bit-error ratio as the expected bit error ratio for the corresponding time-voltage slice and ending the test operation.


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