The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2017

Filed:

Oct. 05, 2012
Applicant:

Sony Corporation, Tokyo, JP;

Inventors:

Ryo Fukazawa, Kanagawa, JP;

Shunsuke Suzuki, Kanagawa, JP;

Atsuo Fujimaki, Tokyo, JP;

Wataru Hashimoto, Kanagawa, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/02 (2006.01); G06T 11/20 (2006.01); G06T 15/00 (2011.01);
U.S. Cl.
CPC ...
G06T 15/00 (2013.01); G06T 11/206 (2013.01); H04N 13/0275 (2013.01);
Abstract

As a data analysis apparatus that can easily and intuitively identify fine particles and small fine particle populations to be analyzed in a distribution graph and that can obtain accurate statistical data regarding these, a 3D data analysis apparatus is provided that includes a data storage unit which saves measurement data regarding fine particles, an input unit which selects independent three types of variables from the measurement data, a data processing unit which calculates positions and figures in a coordinate space whose coordinate axes are the three types of variables and which creates a 3D stereoscopic image representing characteristic distribution of the fine particles, and a display unit which displays the 3D stereoscopic image and that displays, in the 3D stereoscopic image, the figures in each region of the coordinate space divided into a plurality of regions by a plane in a different color in each region.


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