The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2017
Filed:
Jan. 06, 2016
Fujifilm Corporation, Tokyo, JP;
Kenkichi Hayashi, Saitama, JP;
Masahiko Sugimoto, Saitama, JP;
Yousuke Naruse, Saitama, JP;
Kosuke Irie, Saitama, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
Source image data is subjected to a logarithmic process (gamma correction process) (S), and the luminance distribution of source image data is acquired (S). Then, it is determined whether or not the luminance distribution of source image data corresponds to 'a high luminance scene (highlight scene) biased toward a high luminance side' based on a characteristic of a luminance value equal to or greater than a first threshold value in the luminance distribution of source image data (S). According to the determination result (Y/N of S), a restoration process based on a point spread function of an optical system is controlled (S, S). A restoration filter which is used in the restoration process has a filter coefficient corresponding to image data before the logarithmic process.