The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2017
Filed:
May. 26, 2011
Hirohisa Fukuda, Hitachi, JP;
Kunitaka Asano, Hitachi, JP;
Tadahiro Katane, Hitachiota, JP;
Hiromi Yamazaki, Hitachiota, JP;
Hirohisa Fukuda, Hitachi, JP;
Kunitaka Asano, Hitachi, JP;
Tadahiro Katane, Hitachiota, JP;
Hiromi Yamazaki, Hitachiota, JP;
Hitachi Information & Control Solutions, Ltd., Hitachi-shi, JP;
Abstract
Disclosed are a foreign matter inspection device and a foreign matter inspection method, in which the accurate inspection of foreign matter is performed using captured images by continuous shooting in the state in which a movement locus due to the falling caused by the movement of the foreign matter along the inner wall of a container from the horizontal direction of the container as a result of rotation is formed so as to be long. A rotating device is provided with a rotation control means for executing the rotational motion in which container holding members for holding the container in a horizontal manner or at a constant inclination angle relative to the horizontal axis of the container, and the container are rotated at an angle of 60° or more, and then stopped, wherein a foreign matter detection means detects the foreign matter according to the movement locus of the foreign matter, which is formed using the captured images obtained by the continuous shooting for each rotational motion at constant time.