The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2017

Filed:

Mar. 14, 2014
Applicant:

Sony Corporation, Tokyo, JP;

Inventors:

Xun Xu, Palo Alto, CA (US);

Akira Nakamura, San Jose, CA (US);

Su Wang, San Jose, CA (US);

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00147 (2013.01); G06K 9/6273 (2013.01);
Abstract

For digital pathology imaging, intelligent processing, such as automatic recognition or content-based retrieval, is one significant benefit that drives the wide application of this technology. Before any intelligent processing on pathology images, every image is converted into a feature vector which quantitatively capture its visual characteristics. An algorithm characterizing pathology images with statistical analysis of local responses of neural networks is described herein. The algorithm framework enables extracting sophisticated textural features that are well adapted to the image data of interest.


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