The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2017

Filed:

Jan. 22, 2013
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Jason Howard Messinger, Andover, MA (US);

Charles Burton Theurer, Alplaus, NY (US);

Thomas Eldred Lambdin, Auburn, NY (US);

Michael Christopher Domke, Skaneateles, NY (US);

Sekhar Soorianarayanan, Bangalore, IN;

Scott Leo Sbihli, Lexington, MA (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/40 (2011.01); G06F 17/50 (2006.01); G01N 27/90 (2006.01); G01N 29/04 (2006.01); G01N 29/44 (2006.01); G01N 23/02 (2006.01); G01N 21/954 (2006.01); G06F 11/32 (2006.01); G06T 19/20 (2011.01);
U.S. Cl.
CPC ...
G06F 17/50 (2013.01); G01N 21/954 (2013.01); G01N 23/02 (2013.01); G01N 27/90 (2013.01); G01N 29/043 (2013.01); G01N 29/4472 (2013.01); G06F 11/32 (2013.01); G06T 19/20 (2013.01); G01N 2223/631 (2013.01); G01N 2223/646 (2013.01); G01N 2291/2693 (2013.01); G01N 2291/2694 (2013.01); G06T 2219/004 (2013.01); G06T 2219/2012 (2013.01);
Abstract

A system is provided that includes computer-readable storage configured to store non-destructive testing inspection data relating to a portion of an object that has been inspected. Further, a processor presents a model associated with the object, associates the inspection data with the related portion of the object; and presents an indication of availability of the inspection data on a portion of the presented model. The portion of the presented model relates to the portion of the object associated with the inspection data.


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