The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2017

Filed:

Jan. 29, 2013
Applicant:

Oracle International Corporation, Redwood Shores, CA (US);

Inventors:

Jagannathan Srinivasan, Nashua, NH (US);

Jayanta Banerjee, Nashua, NH (US);

Vinh Thi Kim Nguyen, Fairborn, OH (US);

Assignee:

Oracle International Corporation, Redwood Shores, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30908 (2013.01); G06F 17/30864 (2013.01); G06F 17/30867 (2013.01);
Abstract

A method, system, and computer program product for transforming RDF quads to relational views. The method commences by receiving a named graph, the named graph comprising at least one RDF quad, and analyzing the named graph to produce analysis metadata. The method uses the analysis metadata to generate relational views. The method further comprises publishing a relational view in the form of a SPARQL query. The quality of the results can be quantitatively measured and reported by calculating a goodness score based at least in part on aspects of the relational view definitions. Several variants for transformation include generating relational view definitions formed using a named-graph strict variant, or a named-graph relaxed variant, or a named-graph agnostic variant. The transformations can form outputs responsive to characteristics or properties such as a number of classes, a number of single-valued properties, a number of nullability properties, or a number of type-uniformed ranges.


Find Patent Forward Citations

Loading…