The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2017
Filed:
May. 31, 2012
Hideomi Idei, Tokyo, JP;
Norifumi Nishikawa, Tokyo, JP;
Nobuo Kawamura, Tokyo, JP;
Kazuhiko Mogi, Tokyo, JP;
Masaru Kitsuregawa, Tokyo, JP;
Masashi Toyoda, Tokyo, JP;
Kazuo Goda, Tokyo, JP;
Hideomi Idei, Tokyo, JP;
Norifumi Nishikawa, Tokyo, JP;
Nobuo Kawamura, Tokyo, JP;
Kazuhiko Mogi, Tokyo, JP;
Masaru Kitsuregawa, Tokyo, JP;
Masashi Toyoda, Tokyo, JP;
Kazuo Goda, Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
The University of Tokyo, Tokyo, JP;
Abstract
This analysis system analyzes the behavior of a DBMS in a computer system having a computer which executes tasks in parallel and reads data from a database (DB) when executing a query. This analysis system acquires the number of selected rows corresponding to a key value of an index key used in the query, and calculates a model-based predicted degree of processing parallelism of the processing corresponding to the query. The system acquires, from the storage device, event information on an input-output event with respect to the storage medium when the processing corresponding to the query is executed actually, calculates a measured degree of processing parallelism when the processing corresponding to the query is executed actually, based on the event information, and displays information based on the model-based predicted degree of processing parallelism and the measured degree of processing parallelism.