The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2017
Filed:
Mar. 13, 2014
Sas Institute Inc., Cary, NC (US);
Christian Macaro, Raleigh, NC (US);
Jan Chvosta, Raleigh, NC (US);
Mark Roland Little, Cary, NC (US);
SAS Institute Inc., Cary, NC (US);
Abstract
Techniques for automated Bayesian posterior sampling using Markov Chain Monte Carlo and related schemes are described. In an embodiment, one or more values in an accuracy phase for a system configured for Bayesian sampling may be initialized. Sampling may be performed in the accuracy phase based upon the one or more values to generate a plurality of samples. The plurality of samples may be evaluated based upon one or more accuracy criteria. The accuracy phase may be exited when the plurality of samples meets the one or more accuracy criteria. Other embodiments are described and claimed.