The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2017
Filed:
Jul. 10, 2012
Applicants:
Jeremy R. Cooper, Issaquah, WA (US);
Justin Kyle Curts, Issaquah, WA (US);
Inventors:
Jeremy R. Cooper, Issaquah, WA (US);
Justin Kyle Curts, Issaquah, WA (US);
Assignee:
GE Healthcare Bio-Sciences Corp., Piscataway, NJ (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); G01N 21/64 (2006.01); G02B 21/16 (2006.01);
U.S. Cl.
CPC ...
G02B 21/06 (2013.01); G01N 21/6458 (2013.01); G02B 21/16 (2013.01); G01N 2021/6419 (2013.01); G01N 2021/6421 (2013.01); G01N 2021/6423 (2013.01);
Abstract
Microscopy instruments with detectors located on one side of the instruments are disclosed. The microscopy instruments include a splitting system and an array of detectors disposed on one side of the instrument. A beam composed of two or more separate emission channels is separated by the splitting system into two or more beams that travel along separate paths so that each beam reaches a different detector in the array of detectors. Each beam is a different emission channel and the beams are substantially parallel.