The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2017
Filed:
Apr. 17, 2014
Huazhong University of Science and Technology, Wuhan, Hubei, CN;
Xuewen Shu, Hubei, CN;
Miguel Angel Preciado, Fife, GB;
Huazhong University of Science and Technology, Wuhan, Hubei, CN;
Abstract
A delay line interferometer comprising an optical waveguide having a distributed Bragg reflector, e.g. Bragg grating, fabricated therein. The distributed Bragg reflector has a refractive index modulation with a period variation Λ(z) along its length z that is arranged to output in transmission an output optical signal f(t) in response to a input optical signal f(t), wherein the output optical signal f(t) is the result of temporal interference between one or more time-delayed replicas of the input optical signal f(t). In other words, the distributed Bragg reflector is operable to generate and permit temporal interference between two or more time-delayed replicas of the input optical signal f(t). The invention may thus mimic the behaviour of one or more MZIs.