The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2017
Filed:
Dec. 15, 2014
Applicant:
General Electric Company, Schenectady, NY (US);
Inventor:
Chang Lyong Kim, Waukesha, WI (US);
Assignee:
General Electric Company, Schenectady, NY (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/20 (2006.01); G01T 1/202 (2006.01); G01T 1/29 (2006.01); B23K 26/00 (2014.01); B23K 26/352 (2014.01); B28D 5/00 (2006.01); G01T 1/164 (2006.01); B23K 103/00 (2006.01);
U.S. Cl.
CPC ...
G01T 1/2002 (2013.01); B23K 26/0006 (2013.01); B23K 26/0066 (2013.01); B23K 26/352 (2015.10); B28D 5/00 (2013.01); G01T 1/1644 (2013.01); G01T 1/202 (2013.01); G01T 1/2006 (2013.01); G01T 1/2985 (2013.01); B23K 2203/50 (2015.10);
Abstract
A scintillator crystal array that is configured to receive rays emitted by an object to be imaged and to emit light energy responsive to the received rays includes plural crystals. At least one of the crystals includes an upper surface, a lower surface disposed opposite the upper surface, plural sides extending between the upper surface and the lower surface, and a micro-crack surface extending at least partially along at least one of the sides. The micro-crack surface includes micro-cracks formed in the crystal configured for controlling distribution of light through the crystal.