The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2017

Filed:

Apr. 15, 2014
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Hirofumi Taki, Osaka, JP;

Kenichi Nagae, Yokohama, JP;

Toru Sato, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04K 3/00 (2006.01); G01S 15/02 (2006.01); G01S 7/52 (2006.01); G01S 15/89 (2006.01);
U.S. Cl.
CPC ...
G01S 15/02 (2013.01); G01S 7/52 (2013.01); G01S 7/52047 (2013.01); G01S 15/8977 (2013.01); G01S 15/8918 (2013.01);
Abstract

An object information acquisition apparatus according to an embodiment of the present invention includes a plurality of transducer elements each configured to transmit an acoustic wave to an object, to receive reflected waves reflected from inside the object, and to convert the reflected waves into a time-series reception signal; and a processor configured to perform frequency domain interferometry combined with adaptive signal processing by using the reception signals output from the plurality of transducer elements and a reference signal so as to obtain acoustic characteristics at a plurality of positions located inside the object. The processor is configured to switch the reference signal to another reference signal at least once in accordance with a target position located inside the object while performing the frequency domain interferometry so as to obtain the acoustic characteristics at the plurality of positions located inside the object.


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