The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2017
Filed:
Aug. 22, 2014
Hitachi, Ltd., Tokyo, JP;
Ryota Sato, Tokyo, JP;
Toru Shirai, Tokyo, JP;
Yo Taniguchi, Tokyo, JP;
Hisaaki Ochi, Tokyo, JP;
Yoshitaka Bito, Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
Disclosed is a magnetic resonance imaging apparatus that calculates a susceptibility map using a weighting image that reflects a phase variation with high accuracy. The weighting image is calculated from a phase image obtained from a complex image obtained by MRI. First, a region used in calculation of the phase variation is set as a calculation region, and then, a standard deviation or a variance of pixel values of the phase image in the calculation region is set as the phase variation. Further, the phase variation is converted into a weight that monotonically decreases in a broad sense as the phase variation increases to obtain the weighting image.