The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2017

Filed:

Oct. 08, 2013
Applicant:

Sony Corporation, Tokyo, JP;

Inventor:

Yukio Miyaki, Fukushima, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/36 (2006.01); B60L 3/12 (2006.01); B60L 11/18 (2006.01);
U.S. Cl.
CPC ...
G01R 31/36 (2013.01); B60L 3/12 (2013.01); B60L 11/1857 (2013.01); B60L 11/1861 (2013.01); G01R 31/3679 (2013.01); B60L 2240/545 (2013.01); B60L 2240/547 (2013.01); B60L 2240/549 (2013.01); B60L 2260/44 (2013.01); G01R 31/3651 (2013.01); Y02T 10/705 (2013.01); Y02T 10/7011 (2013.01); Y02T 10/7044 (2013.01);
Abstract

A method of estimating a battery life includes: for a secondary battery having a degradation rate R when X days have elapsed after initial charge of the secondary battery, calculating a degradation estimation value (X+Y) days after the initial charge from degradation master data, the degradation master data being identified with use of conditions of temperature T provided for the calculation and a battery state S provided for the calculation; and deriving number of elapsed days Xcorr giving the degradation rate R based on the identified degradation master data, and calculating the degradation estimation value (Xcorr+Y) days after the initial charge from the identified degradation master data.


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