The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2017
Filed:
Feb. 14, 2012
Kazuyuki Oguri, Tokyo, JP;
Tomohiro Endo, Tokyo, JP;
Hidenobu Kawada, Tokyo, JP;
Yasushi Kondo, Tokyo, JP;
Takeshi Muranaka, Tokyo, JP;
Kazuyuki Oguri, Tokyo, JP;
Tomohiro Endo, Tokyo, JP;
Hidenobu Kawada, Tokyo, JP;
Yasushi Kondo, Tokyo, JP;
Takeshi Muranaka, Tokyo, JP;
Fujirebio Inc., Tokyo, JP;
Abstract
A measurement device that includes a plurality of lines for conveying a reaction container containing a sample and measures a predetermined material included in the sample while conveying the reaction container by the plurality of lines, wherein the plurality of lines include: a first reaction line for conveying a reaction container at a first convey speed; a second reaction line for conveying a reaction container at a second convey speed; and a measurement line for measuring a predetermined material included in a sample reacted with a reagent within the reaction container in the first reaction line and a sample reacted with a reagent within the reaction container in the second reaction line, the measurement line conveying the reaction containers at a third convey speed that is higher than the first convey speed and the second convey speed.