The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2017
Filed:
Dec. 04, 2015
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventor:
Tomohiro Sugimoto, Yoshikawa, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/41 (2006.01); G01N 21/45 (2006.01); G01M 11/02 (2006.01); G01N 21/958 (2006.01);
U.S. Cl.
CPC ...
G01N 21/45 (2013.01); G01M 11/0214 (2013.01); G01M 11/0228 (2013.01); G01N 21/958 (2013.01);
Abstract
A test unit is formed by sandwiching a test lens by a first reference lens whose shape and refractive index are known, a second reference lens whose shape and refractive index are known, and a medium. A wavefront of light transmitted through the test unit is measured, and, by using the shape and the refractive index of the first reference lens, the shape and refractive index of the second reference lens, and the measured wavefront of the test unit, the refractive index distribution of the test lens is calculated.