The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2017

Filed:

Aug. 31, 2015
Applicant:

Mettler-toledo Ag, Greifensee, CH;

Inventors:

Tomasz Pol, Severna Park, MD (US);

Chun-Hung Kuo, Alexandria, VA (US);

William Alan Marks, Woodbine, MD (US);

Assignee:

METTLER-TOLEDO GMBH, Greifensee, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/27 (2006.01); G01N 21/31 (2006.01); G01N 21/90 (2006.01);
U.S. Cl.
CPC ...
G01N 21/276 (2013.01); G01N 21/274 (2013.01); G01N 21/31 (2013.01); G01N 21/278 (2013.01); G01N 21/90 (2013.01); G01N 2021/3137 (2013.01); G01N 2201/061 (2013.01); G01N 2201/068 (2013.01); G01N 2201/08 (2013.01);
Abstract

Apparatuses and methods are disclosed for performing a light-absorption measurement on a test sample and a compliance measurement on a reference sample. A method includes moving a reference sample receptacle carrier of an apparatus to position a first reference sample receptacle received in the carrier at a second position in a light path, directing light from an illumination system to a detection system along the light path to perform a light-absorption measurement on a first reference sample at the second position, moving the carrier to position the first receptacle out of the light path, placing a test sample receptacle in a test sample receptacle holder of the apparatus in the light path at a first position different from the second position, and directing light along the light path to perform a light-absorption measurement on a test sample in the test sample receptacle holder at the first position.


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