The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2017

Filed:

Feb. 05, 2014
Applicant:

Schlumberger Technology Corporation, Sugar Land, TX (US);

Inventors:

Maxim Andreevich Chertov, Salt Lake City, UT (US);

Roberto Suarez-Rivera, Salt Lake City, UT (US);

Dean M. Willberg, Salt Lake City, UT (US);

Sidney J. Green, Salt Lake City, UT (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/08 (2006.01); G01N 7/00 (2006.01); G01N 33/24 (2006.01);
U.S. Cl.
CPC ...
G01N 15/082 (2013.01); G01N 7/00 (2013.01); G01N 15/08 (2013.01); G01N 15/0806 (2013.01); G01N 15/088 (2013.01); G01N 15/0826 (2013.01); G01N 33/24 (2013.01);
Abstract

A method for characterizing properties of a manufactured rock sample that employs first and second test apparatus. The first test apparatus includes a sample holder and associated pressure sensors, wherein the sample holder allows for a pulse of test fluid to flow through the sample, and the pressure sensors measure pressure upstream and downstream of the sample as the pulse of test fluid flows through the sample. The second test apparatus includes a sample cell and associated pressure sensor, wherein the sample cell has a configuration where the sample cell is isolated and filled with test fluid under pressure and the pressure sensor measures pressure of the isolated sample cell. The first and second test apparatus are used to measure bulk properties of the sample. The sample is partitioned into pieces, and the second test apparatus is used to measure properties for different size-groups of such sample pieces.


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