The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2017

Filed:

Sep. 18, 2015
Applicants:

Stephen Arnold, New York, NY (US);

Ta Kang Keng, Rego Park, NY (US);

Siyka Shopova, Staten Island, NY (US);

Inventors:

Stephen Arnold, New York, NY (US);

Ta Kang Keng, Rego Park, NY (US);

Siyka Shopova, Staten Island, NY (US);

Assignee:

New York University, New York, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/02 (2006.01); G01N 21/31 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 15/0205 (2013.01); G01N 21/31 (2013.01); G01N 2015/0038 (2013.01);
Abstract

Example systems and methods are provided to determine the size and/or mass of a particle, such as a nanoparticle for example, deterministically (i.e., non-statistically). At least two resonances of the same radial order, having the same angular momentum number l but different azimuthal numbers m (−l<m<l) are excited in a WGM resonator. The particle's latitude angle on the WGM resonator is located using a ratio of detected resonance wavelength shifts. Finally, at least one of (A) the particle's size, and (B) the particle's mass, is determined from the latitude angle of the particle.


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