The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2017

Filed:

Mar. 27, 2015
Applicant:

Sysmex Corporation, Kobe-shi, Hyogo, JP;

Inventors:

Ryuichiro Ebi, Kobe, JP;

Koki Tajima, Kobe, JP;

Toshikuni Suganuma, Kobe, JP;

Assignee:

SYSMEX CORPORATION, Kobe-Shi, Hyogo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/00 (2006.01); G01N 21/75 (2006.01); B01L 3/02 (2006.01); B01D 35/00 (2006.01); G01N 1/28 (2006.01); G01N 1/40 (2006.01); C12N 5/071 (2010.01); G01N 33/487 (2006.01); G01N 15/10 (2006.01); G01N 15/14 (2006.01);
U.S. Cl.
CPC ...
G01N 1/28 (2013.01); C12N 5/0682 (2013.01); G01N 1/4077 (2013.01); G01N 33/4875 (2013.01); G01N 15/1459 (2013.01); G01N 2001/4088 (2013.01); G01N 2015/1006 (2013.01);
Abstract

A sample preparation device includes: a filter member including a filter configured to separate cells being an analysis target from other components in a sample; a first receptacle and a second receptacle configured to be connected to each other via the filter; a third receptacle capable of holding the sample therein; a negative pressure section configured to apply a negative pressure into the second receptacle, thereby to move the sample in the third receptacle toward the filter via the first receptacle, and thereby to move components other than the analysis target into the second receptacle via the filter; and a positive pressure section configured to apply a positive pressure from the second receptacle side to the filter to which cells being the analysis target are attached.


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