The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2017
Filed:
Mar. 07, 2013
Method and device for localizing a defect in an electrochemical store and defect localization system
Applicant:
Robert Bosch Gmbh, Stuttgart, DE;
Inventors:
Assignee:
Robert Bosch GmbH, Stuttgart, DE;
Primary Examiner:
Int. Cl.
CPC ...
G01M 3/00 (2006.01); H01M 10/42 (2006.01); G01R 31/36 (2006.01); H01M 10/625 (2014.01); H01M 10/615 (2014.01); H01M 10/6571 (2014.01); H01M 10/0525 (2010.01);
U.S. Cl.
CPC ...
G01M 3/002 (2013.01); G01R 31/36 (2013.01); H01M 10/4207 (2013.01); H01M 10/4228 (2013.01); H01M 10/615 (2015.04); H01M 10/625 (2015.04); H01M 10/6571 (2015.04); H01M 10/0525 (2013.01); H01M 2220/20 (2013.01); Y02E 60/122 (2013.01);
Abstract
The invention relates to a method for localizing a defect in an electrochemical store (). The method includes a step of controlling the temperature of a subarea () of the electrochemical store () to increase an internal pressure of the subarea (), a step of detecting a measured value which represents an escape of a component from the subarea () occurring in response to the increased internal pressure of the subarea (), and a step of localizing the defect in the subarea () when the measured value is in a predetermined relation to a comparison value.