The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2017
Filed:
Nov. 13, 2013
M Squared Lasers Limited, Glasgow, GB;
Gordon Robertson, Glasgow Strathclyde, GB;
M SQUARED LASERS LIMITED, Glasgow, GB;
Abstract
An Mvalue beam profiling apparatus and method is described. The Mvalue beam profiler comprises an optical axis defined by a focussing lens assembly and a detector, wherein the focussing lens acts to create an artificial waist within an optical field propagating along the optical axis. The beam profiler also comprises a multiple blade assembly having a first set of blades located at an artificial waist position and a second set of blades longitudinally separated along the optical axis from the artificial waist position. The multiple blade assembly therefore provides a means for selectively passing the blades through the location of the optical axis. Employing these measured widths allows for the Mvalue of the optical field to be determined.