The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2017
Filed:
Mar. 21, 2013
Ludwig Maximilians Universität München, München, DE;
Ludwig-Maximilians-Universität München, München, DE;
Abstract
At least one embodiment of the method is designed to create a two-dimensional image of a three-dimensional sample. The method comprises the following steps: provision of a wave-length-tunable light source () that emits primary radiation (P) with wavelengths that vary over time; sampling of location points of the sample () with the primary radiation (P); collection of secondary radiation (S), wherein the secondary radiation (S) is a part of the primary radiation (P) reflected by the sample (); creation of an interferometer-based detection signal for a plurality of sample areas, each with at least one location point, using a detection unit (), wherein the detection signal is created as a difference signal from two output signals of a beam splitter () that receives reference radiation (R) and/or secondary radiation (S) at two inputs, wherein the reference radiation (R) is a portion of the primary radiation (P) that is not guided to the sample (); and determination of a brightness value for at least one of the sample areas from the associated detection signal, wherein the determination of the brightness values is not substantially based on the summation of the individual signal amplitudes of the results of a Fourier transformation.