The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2017
Filed:
Apr. 14, 2017
Applicant:
Sumco Corporation, Minato-ku, Tokyo, JP;
Inventors:
Toshiaki Sudo, Akita, JP;
Tadahiro Sato, Akita, JP;
Ken Kitahara, Akita, JP;
Masami Ohara, Akita, JP;
Assignee:
SUMCO CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); C30B 15/10 (2006.01); C30B 29/06 (2006.01); C30B 15/14 (2006.01); C30B 15/00 (2006.01); C30B 35/00 (2006.01); G01N 21/65 (2006.01);
U.S. Cl.
CPC ...
C30B 15/10 (2013.01); C30B 15/14 (2013.01); C30B 29/06 (2013.01); C30B 15/00 (2013.01); C30B 35/002 (2013.01); G01N 21/65 (2013.01);
Abstract
A quality-evaluated vitreous silica crucible for pulling silicon single crystal is provided, wherein an inner surface of the vitreous silica crucible has regions where surface defects including brown rings are to be generated when pulling silicon single crystal. The regions are distinguished using an infrared absorption spectrum or a Raman shift of the regions, wherein a position of each region and/or a density of the regions are/is specified.