The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2017

Filed:

Feb. 26, 2010
Applicants:

Takayuki Shinohara, Anan, JP;

Shoji Hosokawa, Anan, JP;

Inventors:

Takayuki Shinohara, Anan, JP;

Shoji Hosokawa, Anan, JP;

Assignee:

NICHIA CORPORATION, Anan-Shi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C09K 11/77 (2006.01); C09K 11/08 (2006.01); H01L 33/50 (2010.01);
U.S. Cl.
CPC ...
C09K 11/0883 (2013.01); C09K 11/7734 (2013.01); C09K 11/7792 (2013.01); H01L 33/502 (2013.01); H01L 2224/16245 (2013.01); H01L 2924/181 (2013.01);
Abstract

A fluorescent substance is provided having excellent temperature properties and capable of being excited by light in the region from near ultraviolet to short-wavelength visible light to emit light of yellow to red color. A process for producing the fluorescent substance, and a light emitting device using the fluorescent substance is also provided. The fluorescent substance includes M which is at least one group II element selected from Ca, Sr, and Ba, and Al, Si, O, and N, and activated with Eu. The fluorescent substance has an X-ray diffraction pattern using CuKα radiation, in which the intensity of the diffraction peak in the Bragg angle range of 17.9° to 18.5° is taken as 100%, the relative intensity of the diffraction peak is 150% to 310% in a Bragg angle range of 24.5° to 25.1° , and is 320% to 550% in a Bragg angle range of 34.8° to 35.4°.


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