The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2017

Filed:

Mar. 04, 2015
Applicant:

Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;

Inventors:

Masataka Takenami, Aichi, JP;

Satoshi Abe, Osaka, JP;

Isamu Matsumoto, Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B22F 3/105 (2006.01); B29C 67/00 (2017.01); B33Y 10/00 (2015.01); B33Y 50/02 (2015.01); B22F 3/24 (2006.01);
U.S. Cl.
CPC ...
B22F 3/1055 (2013.01); B29C 67/0077 (2013.01); B33Y 10/00 (2014.12); B33Y 50/02 (2014.12); B22F 2003/1057 (2013.01); B22F 2003/247 (2013.01); Y02P 10/295 (2015.11);
Abstract

There is provided a selective laser sintering method capable of reducing the bulge of the peripheral portion corresponding to the periphery of the three-dimensional shaped object. The manufacturing method according to an embodiment of the present invention includes alternate repetition of a powder-layer forming and a solidified-layer forming, the repetition comprising: (i) forming a solidified layer by irradiating a predetermined portion of a powder layer with a light beam, thereby sintering the powder in the predetermined portion or a melting and subsequently solidifying the powder; and (ii) forming another solidified layer by newly forming a powder layer on the formed solidified layer, followed by irradiation of a predetermined portion of the newly formed powder layer with the light beam, wherein a scanning of the light irradiation is divided into light beam-scannings 'A' and 'B'.


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