The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2017
Filed:
Dec. 04, 2013
Kabushiki Kaisha Topcon, Tokyo, JP;
Hiroaki Okada, Saitama, JP;
Taisaku Kogawa, Mitaka, JP;
Takashi Fujimura, Fujimino, JP;
Kohta Fujii, Toda, JP;
KABUSHIKI KAISHA TOPCON, Tokyo, JP;
Abstract
An ophthalmologic apparatus capable of performing suitable examination according to the state of the eye includes an examination optical system used to examine an eye, a drive part, two or more imaging parts, an analyzer, and a controller. The drive part moves the examination optical system. The two or more imaging parts substantially simultaneously photograph the anterior segment of the eye from different directions. The analyzer analyzes photographic images captured by the two or more imaging parts to obtain the three-dimensional position of the eye, and displacement information indicating the displacement direction and displacement amount of the eye due to eye movement. The controller performs a first alignment process of controlling the drive part based on the three-dimensional position to move the examination optical system and a second alignment process of controlling the drive part based on the displacement information to move the examination optical system.