The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2017
Filed:
Sep. 12, 2014
Applicant:
Amazon Technologies, Inc., Reno, NV (US);
Inventors:
Hyuk-Joon Oh, Cupertino, CA (US);
Eddie Alex Azuma, Pleasanton, CA (US);
Assignee:
Amazon Technologies, Inc., Seattle, WA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 17/00 (2006.01); H04N 9/31 (2006.01);
U.S. Cl.
CPC ...
H04N 17/002 (2013.01); H04N 9/31 (2013.01);
Abstract
Systems and methods for testing a light emitting device are described. A processing device receives image data from an image capturing device of an electronic device. The image data represents of an image of a projection, on a projection surface, of beam of light emitted by a light emitting device of the electronic device. The processing device determines one or more imaging calibration parameters based on the image.
Oh, Hyuk-Joon. (2017). Light uniformity testing (U.S. Patent No. 9706197). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9706197
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile