The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 11, 2017

Filed:

Dec. 01, 2015
Applicants:

Hiroyuki Igawa, Kanagawa, JP;

Hideki Kamaji, Kanagawa, JP;

Inventors:

Hiroyuki Igawa, Kanagawa, JP;

Hideki Kamaji, Kanagawa, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 15/02 (2006.01); G06K 15/14 (2006.01); H04N 1/405 (2006.01); H04N 1/40 (2006.01);
U.S. Cl.
CPC ...
H04N 1/4051 (2013.01); G06K 15/1881 (2013.01);
Abstract

An image processing apparatus stores a first dither pattern group that includes dither patterns each corresponding to a gradation value in a first range and formed by line screens in which widths of lines are increased with an increase in the gradation value, a second dither pattern group that includes dither patterns each corresponding to a gradation value in a second range higher than the gradation value in the first range, and formed by void dot screens in which number of dots is increased and void regions surrounded by the dots are decreased with an increase in the gradation value, and a third dither pattern group that includes dither patterns for switching from the line screen to the void dot screen, switching to the void dot screen being completed before a first reference gradation value at which an image defect occurs for received image data is reached.


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