The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 11, 2017

Filed:

Jun. 25, 2012
Applicant:

Ian Morris, Bognor Regis, GB;

Inventor:

Ian Morris, Bognor Regis, GB;

Assignee:

ASTRIUM LIMITED, Stevenage, Hertfordshire, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2015.01); H01P 5/18 (2006.01); H04B 17/40 (2015.01);
U.S. Cl.
CPC ...
H04B 17/40 (2015.01); H04B 17/0085 (2013.01);
Abstract

A test arrangement includes a multi-port test interface having a first waveguide coupled to a plurality of second waveguides. The first waveguide is arranged to propagate an input signal and each of the second waveguides is arranged to output the input signal, providing a plurality of test signals to be supplied to a communications apparatus. Such a test interface may also be used to output respective channel signals in a multiplexed signal received from a communications apparatus. The test interface permits the provision and/or monitoring of a large number of channel signals without separate respective connections to the communications apparatus. This may be particularly useful where tests are performed in a constrained space and/or where repeated access to the apparatus is impractical. The simultaneous provision of many channel signals may allow evaluation of co-channel interference.


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