The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2017
Filed:
Jan. 15, 2014
Applicant:
Texas Instruments Incorporated, Dallas, TX (US);
Inventors:
Fernando A Mujica, Allen, TX (US);
Lei Ding, Plano, TX (US);
Assignee:
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04K 1/02 (2006.01); H04L 25/03 (2006.01); H04L 25/49 (2006.01); H04B 1/04 (2006.01); H03F 1/32 (2006.01); H03F 3/195 (2006.01); H03F 3/24 (2006.01);
U.S. Cl.
CPC ...
H04B 1/0475 (2013.01); H03F 1/3247 (2013.01); H03F 3/195 (2013.01); H03F 3/24 (2013.01); H03F 2200/451 (2013.01); H03F 2201/3212 (2013.01);
Abstract
Embodiments of the invention provide a DPD system where the transmit reference signal is transformed, including sub-sampling, frequency translation, and the like, to match the feedback signal, which goes thru a similar transformation process, to obtain an error signal. The same transformation is applied to a system model, which may be Jacobian, Hessian, Gradient, or the like, in an adaptation algorithm to minimize error.