The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 11, 2017

Filed:

Mar. 16, 2015
Applicant:

Maxim Integrated Products, Inc., San Jose, CA (US);

Inventors:

Robert Michael Muchsel, Addison, TX (US);

Donald Wood Loomis, III, Coppell, TX (US);

Edward Tangkwai Ma, Plano, TX (US);

Hung Thanh Nguyen, Plano, TX (US);

Nancy Kow Iida, Irving, TX (US);

Mark Alan Lovell, Lucas, TX (US);

Assignee:

Maxim Integrated Products, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 9/08 (2006.01); H03K 19/003 (2006.01);
U.S. Cl.
CPC ...
H03K 19/00315 (2013.01); H04L 9/0861 (2013.01); H04L 2209/24 (2013.01);
Abstract

Presented are systems and methods that allow hardware designers to protect valuable IP and information in the hardware domain in order to increase overall system security. In various embodiments of the invention this is accomplished by configuring logic gates of existing logic circuitry based on a key input. In certain embodiments, a logic function provides results that are dependent not only on input values but also on an encrypted logic key that determines connections for a given logic building block, such that the functionality of the logic function cannot be determined by reverse engineering. In some embodiments, the logic key is created by decrypting a piece of data using a secret decryption key. Advantages of automatic encryption include that existing circuitry need not be re-implemented or re-built, and that the systems and methods presented are backward compatible with standard manufacturing tools.


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