The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 11, 2017

Filed:

Jan. 31, 2013
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Yohei Murayama, Kawasaki, JP;

Toshiki Ito, Kawasaki, JP;

Chieko Mihara, Isehara, JP;

Motoki Okinaka, Inagi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/027 (2006.01); B29C 33/62 (2006.01); B29C 39/02 (2006.01); G03F 7/00 (2006.01); G03F 7/004 (2006.01); G03F 7/027 (2006.01); B82Y 15/00 (2011.01); B82Y 10/00 (2011.01); B82Y 40/00 (2011.01); G03F 1/76 (2012.01); H01L 21/308 (2006.01); B29C 35/08 (2006.01);
U.S. Cl.
CPC ...
H01L 21/0274 (2013.01); B29C 33/62 (2013.01); B29C 39/026 (2013.01); B82Y 10/00 (2013.01); B82Y 15/00 (2013.01); B82Y 40/00 (2013.01); G03F 1/76 (2013.01); G03F 7/0002 (2013.01); G03F 7/0046 (2013.01); G03F 7/0048 (2013.01); G03F 7/027 (2013.01); H01L 21/3081 (2013.01); B29C 2035/0827 (2013.01);
Abstract

It is intended to provide a photocured product that is prepared using the photo-imprint method and has favorable pattern precision and improvement in pattern defects. The present invention provides a photocured product obtained by irradiating a coating film in contact with a mold with light, the photocured product containing a fluorine atom-containing surfactant, wherein of secondary ion signals obtained by the surface analysis of the photocured product based on time-of-flight secondary ion mass spectrometry, the intensity of a CHOion signal is higher than that of a CHOion signal.


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