The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 11, 2017

Filed:

Oct. 30, 2014
Applicant:

Amazon Technologies, Inc., Reno, NV (US);

Inventors:

Vivek Shah, Seattle, WA (US);

Robert James Hanson, Seattle, WA (US);

Nicholas Ryan Gilmour, San Jose, CA (US);

Assignee:

AMAZON TECHNOLOGIES, INC., Reno, NV (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/00 (2011.01); H04N 5/225 (2006.01); H04N 9/73 (2006.01); G06T 7/00 (2017.01); H04N 9/07 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0065 (2013.01); H04N 9/07 (2013.01);
Abstract

A plurality of depth planes corresponding to a scene within a field of view of a camera of a computing device can be computed based on stereographic techniques, infrared transceivers, ultrasonic transceivers, among other approaches. The depth planes can be utilized to independently meter subject matter of interest (e.g., person, object, region, etc.) corresponding to each depth plane to obtain image statistics for each depth plane. The image statistics can be analyzed to determine optimal settings (e.g., focus, exposure, white balance, etc.) for each depth plane, and a camera can be configured to acquire image data according to the optimal settings for one or more of the depth planes. Further, the image statistics can be leveraged for processing portions of the image data that are not optimized during capture. Thus, a final image can reflect optimizations for multiple subject matter of interest located at various distances from a computing device.


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