The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 11, 2017

Filed:

Jun. 10, 2014
Applicant:

Toshiba Medical Systems Corporation, Otawara-Shi, Tochigi-Ken, JP;

Inventors:

Satoru Nakanishi, Utsunomiya, JP;

Alexander Zamyatin, Hawthorne Woods, IL (US);

Be-Shan Chiang, Austin, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 5/00 (2006.01); A61B 6/03 (2006.01); A61B 6/00 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G06T 5/001 (2013.01); A61B 6/032 (2013.01); A61B 6/4085 (2013.01); A61B 6/5282 (2013.01); G06T 5/002 (2013.01); G06T 11/005 (2013.01); G06T 2207/10081 (2013.01); G06T 2211/416 (2013.01);
Abstract

Cone beam artifacts arise in circular CT reconstruction. The cone beam artifacts are substantially removed by reconstructing a reference image from measured data at circular source trajectory, generating synthetic data by forward projection of the reference image along a pre-determined source trajectory, which supplements the circular source trajectory to a theoretically complete trajectory, reconstructing a correction image from the synthetic data and applying a scaling factor whose value is adaptively determined and optimized based upon the minimization of a predetermined cone beam artifact metric. Ultimately, the cone beam artifact is substantially reduced by generating a corrected image using the reference image and the correction image that has been optimally scaled based upon the adaptively determined scaling factor value.


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