The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9704105 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 11, 2017

Filed:

May. 16, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Dan He, Ossining, NY (US);

Laxmi P. Parida, Mohegan Lake, NY (US);

Irina Rish, Rye Brook, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01); G06N 99/00 (2010.01); G06K 9/62 (2006.01); G06F 17/18 (2006.01); G06F 17/30 (2006.01); G06F 19/24 (2011.01);
U.S. Cl.
CPC ...
G06N 99/005 (2013.01); G06F 17/18 (2013.01); G06F 17/30592 (2013.01); G06K 9/6247 (2013.01); G06K 9/6256 (2013.01); G06F 19/24 (2013.01);
Abstract

Various embodiments select features from a feature space. In one embodiment, a set of training samples and a set of test samples are received. A first centered Gram matrix of a given dimension is determined for each of a set of feature vectors that include at least one of the set of training samples and at least one of the set of test samples. A second centered Gram matrix of the given dimension is determined for a target value vector that includes target values from the set of training samples. A set of columns and rows associated with the at least one of the test samples in the second centered Gram matrix is set to 0. A subset of features is selected from a set of features based on the first and second centered Gram matrices.


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