The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2017
Filed:
Dec. 29, 2014
Hanwha Techwin Co., Ltd., Changwon-si, KR;
Hanwha Techwin Co., Ltd., Changwon-si, KR;
Abstract
A method of sampling feature points, an image matching method using the same, and an image matching processor are disclosed. The method of sampling feature points for image matching includes: dividing a first image into a plurality of regions corresponding to a number of feature points to be sampled; extracting a sampled feature point from each of the regions such that a distance between a sampled feature point of one region and a sampled feature point of another region satisfies a predetermined condition; and estimating a homography on the basis of the extracted sampled feature points and corresponding sampled feature points of a second image to be matched with the first image.