The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 11, 2017

Filed:

Sep. 15, 2015
Applicant:

Siemens Aktiengesellschaft, Munich, DE;

Inventors:

Wilhelm Horger, Schwaig, DE;

Miriam Keil, Erlangen-Dechsendorf, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); A61B 5/055 (2006.01); G01R 33/54 (2006.01); G01R 33/483 (2006.01); G01R 33/46 (2006.01);
U.S. Cl.
CPC ...
G06K 9/46 (2013.01); A61B 5/055 (2013.01); G01R 33/543 (2013.01); G01R 33/46 (2013.01); G01R 33/483 (2013.01);
Abstract

In a method for planning a spectroscopy measurement of an examination object by operation of a magnetic resonance apparatus, an image data record is selected that includes at least two images of a magnetic resonance measurement of the examination object, an isometric and/or isogonal region is determined in a first image of the at least two images, a region of interest is selected according to the isometric and/or isogonal region determined on the first image, and the first image is displayed, at least one further, second image of the image data record is displayed according to the selected region of interest, and the spectroscopy measurement is planned according to the displayed images.


Find Patent Forward Citations

Loading…