The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 11, 2017

Filed:

Aug. 29, 2013
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Leonard D. Greenwood, Beds, GB;

Arron J. Harden, Olney, GB;

Martin J. Sanders, Bedford, GB;

Julian J. Vizor, Milton Keynes, GB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 17/30 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30563 (2013.01); G06F 11/368 (2013.01); G06F 8/33 (2013.01); G06F 11/3664 (2013.01); G06F 11/3668 (2013.01); G06F 11/3672 (2013.01); G06F 11/3684 (2013.01); G06F 11/3688 (2013.01);
Abstract

Embodiments relate to integrating data transform test with a data transform tool. A method and system are described for creating a data transform test for a data transform job having a data transform script, the method includes determining all data transform units available in the data transform job, determining a subset of the available data transform units for a new test, and generating a subset test execution script for the subset of data transform units from the data transform script. The method further includes determining boundary test data at each boundary of the subset of data transform units, defining a data transform test, and saving the data transform test for later testing. The data transform test includes the subset of data transform units with subset test execution script and with boundary test data.


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