The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2017
Filed:
Apr. 28, 2014
International Business Machines Corporation, Armonk, NY (US);
Yang L. Li, Shang Hai, CN;
Ying N. Zhang, Shang Hai, CN;
Guo Xin Zhao, Jilin Province, CN;
Su Ning Zhao, Shanghai, CN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A technique for testing software includes monitoring whether a predefined event occurs in a software test instance. In response to occurrence of the predefined event, different types of snapshots of the software test instance are generated according to a property of the event. The snapshots are used to record a state of the software test instance when the predefined event occurs. The different types of snapshots are stored in information related to the predefined event.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile