The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 11, 2017

Filed:

Jul. 30, 2014
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Jun Maeoka, Tokyo, JP;

Hideki Nakamura, Tokyo, JP;

Akira Tanaka, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 9/45 (2006.01); G06F 11/36 (2006.01); G06F 11/28 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01); G06F 11/28 (2013.01); G06F 11/36 (2013.01); G06F 11/3668 (2013.01); G06F 11/3644 (2013.01);
Abstract

Provided is a development supporting system that extracts important test cases in accordance with development statuses of a program, test statuses, etc. The development supporting system according to a representative embodiment includes a configuration managing unit that retains and manages the program and each of the test cases in a repository, and a test executing unit that executes the test case and stores a test result in the repository. The test case is managed in the repository in association with information of a type thereof, the configuration managing unit judges a development status of the program and sets a priority for each of the test cases based on the development status, and the test executing unit extracts the test case to be executed based on the priority.


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