The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2017
Filed:
Nov. 04, 2015
International Business Machines Corporation, Armonk, NY (US);
Tomio Amano, Kanagawa-ken, JP;
Natsumi Kurashima, Tokyo, JP;
Hirofumi Matsuzawa, Kanagawa-ken, JP;
Rei Suginaka, Tokyo, JP;
Masaru Yamamoto, Kanagawa-ken, JP;
International Business Machines Corporation, Armonk, NY (US);
Abstract
Detection of defects in an online system includes, for example, receiving, by one or more processor, a plurality of search conditions regarding a search screen of the online system, generating, by the one or more processor, a plurality of test models having factors based on the plurality of search conditions and levels having one or more of the search conditions, generating, by the one or more processor, a plurality of test cases based on the generated plurality of test models having the factors based on the plurality of search conditions and the levels having one or more of the search conditions, and executing, by the one or more processor, the plurality of test cases on the online system to detect defects in the online system.