The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2017
Filed:
Apr. 03, 2014
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Hsu Chien-Jen, Morrisville, NC (US);
Itai Segall, Tel-Aviv, IL;
Rachel Tzoref-Brill, Haifa, IL;
Aviad Zlotnick, Mitzpeh Netofah, IL;
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 11/00 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G06F 11/3616 (2013.01);
Abstract
Techniques for monitoring computer program test design are described herein. The techniques include a method that specifies a subset of tuples in a combinatorial test model as supervised. At least some of the supervised tuples are confirmed using expert data. The method may include determining a metric indicating progress of the combinatorial test modeling process based on the supervised tuples and the confirmed tuples.