The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2017
Filed:
May. 07, 2014
KE Wang, Sugar Land, TX (US);
Spyridon Lazaratos, Houston, TX (US);
Ke Wang, Sugar Land, TX (US);
Spyridon Lazaratos, Houston, TX (US);
ExxonMobil Upstream Research Company, Houston, TX (US);
Abstract
Method for multi-parameter inversion using elastic inversion. This method decomposes data into offset/angle groups and performs inversion on them in sequential order. This method can significantly speed up convergence of the iterative inversion process, and is therefore most advantageous when used for full waveform inversion (FWI). The present inventive approach draws upon relationships between reflection energy and reflection angle, or equivalently, offset dependence in elastic FWI. The invention uses recognition that the amplitudes of small angle (near offset) reflections are largely determined by acoustic impedance alone (), independent for the most part of Vp/Vs. Large angle (middle and far offset) reflections are affected by Ip, Vp/Vs () and other earth parameters such as density () and anisotropy. Therefore, the present inventive method decomposes data into angle or offset groups in performing multi-parameter FWI to reduce crosstalk between the different model parameters being determined in the inversion.