The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2017
Filed:
Jul. 19, 2013
Raytheon Company, Waltham, MA (US);
John T. Broad, Santa Barbara, CA (US);
Lee M. Savage, Santa Barbara, CA (US);
Raytheon Company, Waltham, MA (US);
Abstract
A method for determining a FDOA of a pulsed waveform received by two sensors includes obtaining a respective plurality of in-phase and quadrature-phase (IQ) samples indicative of a pulse envelope of the received pulsed waveform. The method includes determining a TDOA responsive to a leading edge of a pulse of the pulsed waveform and obtaining a first cross correlation of IQ samples at a delay (d) closest to the TDOA, and respective second and third cross correlations at least one additional delay (d+1 and d−1) on either side of the closest delay. The method includes refining the approximation of the TDOA according to an interpolation of amplitudes of the cross-correlation and determining a respective rate of change of cross-correlation phase (Δφ). The method includes approximating a straight line fit to the rates of change of cross-correlation phase (dΔφ/dt), the slope of the straight line representative of the FDOA.