The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2017
Filed:
Dec. 13, 2012
Tdk Corporation, Tokyo, JP;
Kenichi Suzuki, Tokyo, JP;
Tsutomu Chikamatsu, Tokyo, JP;
Akio Ogawa, Tokyo, JP;
Kyung-ku Choi, Tokyo, JP;
Ryuji Hashimoto, Tokyo, JP;
TDK CORPORATION, Tokyo, JP;
Abstract
A magnetic measurement device which can measure the magnetic characteristics in a microregion of a thin plate magnetic sample. After a magnetic sample is applied by a magnetic field and magnetized accordingly, by scanning the magnetic sample using a measuring part, the magnetic flux leakage in the magnetic sample can be measured. The magnetic flux leaks outside by magnetizing a first region and a second region of the magnetic sample in reciprocally opposite directions and reducing the demagnetizing field. Specifically, a magnetic field generating part with at least a pair of magnetic poles is used to perform the magnetization of multiple poles, or the magnetic field generating part applies a damped oscillation magnetic field to perform the magnetization, or a local magnetic field generating part which applies an alternating magnetic field and scans the surface of the sample at the same time is used to perform the magnetization.