The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2017
Filed:
Aug. 29, 2014
Applicant:
Texas Instruments Incorporated, Dallas, TX (US);
Inventors:
Assignee:
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G01R 31/3185 (2006.01); G01R 31/3183 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318547 (2013.01); G01R 31/318385 (2013.01); G01R 31/318575 (2013.01);
Abstract
Apparatus and method for testing an integrated circuit. An integrated circuit includes circuitry to be tested, scan chain logic, and a test adapter. The scan chain logic is configured to transfer test data to and test results from the circuitry. The test adapter is configured to extract the test data from a packet received from an automated test control system and to transfer the test data to the scan chain logic. The test adapter is also configured to receive the test results from the scan chain logic, and to packetize the test result for transmission to the automated test control system.