The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2017
Filed:
Jul. 02, 2013
Applicants:
Takumi Fujita, Kuwana, JP;
Kazuhiro Yagita, Kuwana, JP;
Toshihiko Sasaki, Kanazawa, JP;
Youichi Maruyama, Hamamatsu, JP;
Inventors:
Takumi Fujita, Kuwana, JP;
Kazuhiro Yagita, Kuwana, JP;
Toshihiko Sasaki, Kanazawa, JP;
Youichi Maruyama, Hamamatsu, JP;
Assignee:
NTN CORPORATION, Osaka, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/207 (2006.01); G01N 23/20 (2006.01);
U.S. Cl.
CPC ...
G01N 23/207 (2013.01); G01N 23/20 (2013.01); G01N 2223/624 (2013.01); G01N 2223/632 (2013.01);
Abstract
An inspection method for a bearing part includes the steps of: emitting X-rays onto a fatigued portion of a bearing part to be inspected; detecting annular diffracted X-rays (X-ray diffraction ring) diffracted by the fatigued portion; and estimating a use condition of the bearing part to be inspected, based on the detected annular diffracted X-rays (X-ray diffraction ring).